EPL

Effect of pressure and stress on blistering induced by hydrogen implantation in silicon

C. Coupeau, E. Dion, M.-L. David, J. Colin and J. Grilhé

EPL, 92 1 (2010) 16001

Published online: 22 October 2010

DOI: 10.1209/0295-5075/92/16001

C. Coupeau

E. Dion

M.-L. David

J. Colin

J. Grilhé

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