Quantitative analysis of the weak anti-localization effect in ultrathin bismuth films S. Sangiao, N. Marcano, J. Fan, L. Morellón, M. R. Ibarra and J. M. De Teresa EPL, 95 3 (2011) 37002 Published online: 15 July 2011 DOI: 10.1209/0295-5075/95/37002