Structural characterization of cubic silicon nitride J. Z. Jiang, K. Ståhl, R. W. Berg, D. J. Frost, T. J. Zhou and P. X. Shi Europhys. Lett., 51 1 (2000) 62-67 Published online: 01 September 2002 DOI: 10.1209/epl/i2000-00337-8