Issue |
Europhys. Lett.
Volume 51, Number 1, July I 2000
|
|
---|---|---|
Page(s) | 62 - 67 | |
Section | Condensed matter: structure, mechanical and thermal properties | |
DOI | https://doi.org/10.1209/epl/i2000-00337-8 | |
Published online | 01 September 2002 |
Structural characterization of cubic silicon nitride
1
Department of Physics, Building 307, Technical University of
Denmark DK-2800 Lyngby, Denmark
2
Department of Chemistry, Building 207, Technical University of Denmark
DK-2800 Lyngby, Denmark
3
Bayerisches Geoinstitut, Universität Bayreuth - D-95440 Bayreuth, Germany
4
MIC, Technical University of Denmark - DK-2800 Lyngby, Denmark
Corresponding author: jiang@fysik.dtu.dk
Received:
22
March
2000
Accepted:
9
May
2000
Structural characterization of the third polymorph of silicon nitride, synthesized under high-pressure and high-temperature conditions, has been obtained by Rietveld structure refinements of X-ray powder diffraction data recorded using synchrotron radiation. The material has a cubic spinel structure at 295 K with a space group Fd-3m, Z=8, a unit cell of , nitrogen position , and density . The complete structural data obtained should offer a firm basis for understanding the properties of the novel material. One example is present for the Raman spectroscopy data of the material.
PACS: 61.10.Nz – Single-crystal and powder diffraction / 61.66.-f – Structure of specific crystalline solids / 62.50.+p – High-pressure and shock-wave effects in solids and liquids
© EDP Sciences, 2000
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