Si nanoparticles in SiO2 An atomic scale observation for optimization of optical devices E. Talbot, R. Lardé, F. Gourbilleau, C. Dufour and P. Pareige EPL, 87 2 (2009) 26004 Published online: 30 July 2009 DOI: 10.1209/0295-5075/87/26004