EPL

Double-tip piezoresponse force microscopy for quantitative measurement of the piezoelectric coefficient at the nanoscale

K. Pan, Y. M. Liu, J. L. Peng and Y. Y. Liu

EPL, 104 6 (2013) 67001

Published online: 24 December 2013

DOI: 10.1209/0295-5075/104/67001

K. Pan

Y. M. Liu

J. L. Peng

Y. Y. Liu

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