Volume 104, Number 6, December 2013
|Number of page(s)||5|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||24 December 2013|
Double-tip piezoresponse force microscopy for quantitative measurement of the piezoelectric coefficient at the nanoscale
1 Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, Xiangtan University - Hunan 411105, China
2 Faculty of Materials, Optoelectronics and Physics, Xiangtan University - Hunan 411105, China
3 Department of Mechanical Engineering, University of Washington - Seattle, WA 98195-2600, USA
Received: 25 November 2013
Accepted: 11 December 2013
Since the rotational symmetry of an electric field induced by piezoresponse force microscopy (PFM) can be broken and tuned by a scanning probe microscope (SPM) using multiple tips, a double-tip PFM measurement method is proposed to quantitatively determine the piezoelectric coefficient d33 at the nanoscale, realized by modulating the spacing or voltage ratio between two SPM tips. Compared to the traditional PFM using a single SPM tip, the piezoelectric coefficient measured by the double-tip method agrees much better with the intrinsic value.
PACS: 77.65.Bn – Piezoelectric and electrostrictive constants / 77.84.-s – Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials
© EPLA, 2013
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