Study of elementary surface acoustic wave phenomena
Solid State and Photonics Laboratory, Stanford University -
Stanford, CA 94305, USA
2 Paul-Drude Institute for Solid-State Electronics - D-10117 Berlin, Germany
Corresponding author: email@example.com.
Accepted: 13 February 2001
Many attempts have been made in acoustic microscopy to both achieve nanometer lateral resolution and sub-Å wave amplitude detection. Employing a scanning acoustic force microscopy technique, acoustic wave properties of arbitrarily polarized modes can be measured with sub-wavelength resolution and high sensitivity. Surface acoustic wave fields of elementary model systems like a single scatterer and a single wave source are analysed in detail. We are able to observe radiation patterns, revealing the influence of the anisotropy of the GaAs substrate and the angular distribution of the piezoelectric coupling coefficient.
PACS: 07.79.-v – Scanning probe microscopes and components / 43.35.Pt – Surface waves in solids and liquids / 43.58.+z – Acoustical measurements and instrumentation
© EDP Sciences, 2001