DOI: 10.1209/epl/i2003-00608-x
Europhys. Lett., 63 (6) , pp. 853-859 (2003)

Resonant transmission and frequency trifurcation of light waves in Thue-Morse dielectric multilayers

F. Qiu, R. W. Peng, X. Q. Huang, Y. M. Liu, M. Wang, A. Hu and S. S. Jiang

National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University - Nanjing 210093, PRC

rwpeng@nju.edu.cn

(Received 3 April 2003; accepted in final form 11 July 2003)

Abstract
We present in this letter the observation of the optical resonant transmission of Thue-Morse (TM) dielectric multilayers. For the first time the frequency trifurcation feature has been experimentally demonstrated. This effect can be analogous to the electronic energy spectrum of a TM system, which has not yet been directly obtained in experiments. The resonant transmission originates from the positional correlation of the basic units in the TM system, and is sensitive to the modulation of optical thickness. The experimental results are in good agreement with the theoretical analysis.

PACS
68.60.-p - Physical properties of thin films, nonelectronic.
61.44.Br - Quasicrystals.
78.67.Pt - Multilayers; superlattices.

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