Omnidirectional reflection of electromagnetic waves on Thue-Morse dielectric multilayersF. Qiu, R. W. Peng, X. Q. Huang, X. F. Hu, Mu Wang, A. Hu, S. S. Jiang and D. Feng
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University - Nanjing 210093, PRC
received 6 August 2004; accepted in final form 1 October 2004
published online 3 November 2004
We report here the reflection of electromagnetic waves in self-similar Thue-Morse dielectric multilayers, which presents the features of multiple omnidirectional photonic bandgaps (PBGs). The number and the width of omnidirectional PBG depend on the ratio of the refraction indexes and the thicknesses of the dielectric materials. The theoretical result is partly verified by optical observation in Thue-Morse multilayers with visible and near-infrared light. Our investigations provide a new approach to achieve the omnidirectional reflection in multiple frequency ranges. With this progress, the application of dielectric reflection mirrors can be further widened.
61.44.Br - Quasicrystals.
42.70.Qs - Photonic bandgap materials.
78.67.Pt - Multilayers; superlattices.
© EDP Sciences 2004