Selective study of atoms in rough surfaces by means of off-specular grazing incidence XAFSP. Keil, D. Lützenkirchen-Hecht and R. Frahm
Fachbereich C, Abteilung Physik, Bergische Universität Wuppertal Gaussstrasse 20, 42097 Wuppertal, Germany
received 7 March 2005; accepted in final form 29 April 2005
published online 8 June 2005
A new method of grazing incidence X-ray absorption spectroscopy using an off-specular reflection geometry is presented. Using such an asymmetric setup, with the detector centered at the Yoneda peak, this technique is sensitive to lateral heterogeneities which typically occur at surfaces or interfaces. Oscillations in the spectra above the absorption edges of selected elements enable the atomic short-range order around the X-ray absorbing atom within the surface region to be determined. The data analysis is done in the framework of the distorted wave Born approximation (DWBA).
61.10.Ht - X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.
61.10.Kw - X-ray reflectometry (surfaces, interfaces, films).
68.35.Ct - Interface structure and roughness.
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