Effect of oxygen pressure on structural modulation observed by X-ray reciprocal space mapping in epitaxial bismuth cuprate superconducting filmS. Kaneko1, K. Akiyama1, M. Mitsuhashi1, Y. Hirabayashi1, S. Ohya1, K. Seo2, H. Funakubo3, A. Matsuda4 and M. Yoshimoto4
1 Kanagawa Industrial Technology Research Institute 705-1 Shimo-Imaizumi, Ebina, Kanagawa 243-0435, Japan
2 PANAlytical - 1-7-3 Hamamatsucho, Minato-Ku, Tokyo 105-0013, Japan
3 Department of Innovative and Engineered Materials, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8502, Japan
4 Materials & Structures Laboratory, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan
received 15 April 2005; accepted 22 June 2005
published online 27 July 2005
x (-2212) single layers were prepared on substrates in different conditions of oxygen pressure using a 266 laser generated by slower Q-switched YAG system. Several X-ray diffraction methods were employed to investigate the crystal structure of -2212. X-ray diffraction (XRD) methods of -2 and scan were used to verify the epitaxial growth of -2212(001), and reciprocal space mapping (RSM) of - was employed to investigate in-plane lattice constants and structural modulation. Satellite peaks generated by structural modulation on the RSM showed asymmetric distribution around the main peak. The periodicity of modulation was evaluated using satellite peaks on the RSM. With increasing oxygen pressure, the lattice constant expanded along the c-axis and contracted along the b-axis, while structural modulation expanded along both b- and c-axis directions.
74.78.Bz - High-Tc films.
61.44.Fw - Incommensurate crystals.
61.10.-i - X-ray diffraction and scattering.
© EDP Sciences 2005