Implications of phase-segregation on structure, terahertz emission and magnetization of Bi (Fe1-xMnx)O3 (0 x 0.5) thin filmsD. S. Rana1, I. Kawayama1, K. Takahashi1, K. R. Mavani1, H. Murakami1, M. Tonouchi1, T. Yanagida2, H. Tanaka2 and T. Kawai2
1 Institute of Laser Engineering, Osaka University - 2-6 Yamadaoka, Suita 565-0871, Osaka, Japan
2 Institute of Scientific and Industrial Research, Osaka University - 8-1 Mihogaoka, Ibaraki 567-0047, Osaka, Japan
received 23 July 2008; accepted in final form 18 November 2008; published December 2008
published online 12 January 2009
Structural, magnetic and terahertz emission properties of Bi (Fe1-xMnx)O3 (0 x 0.5) thin films of various thicknesses were studied. A transition from coherently strained structure to relaxed structure at a film thickness (t) of ~ 80– 90 nm occurs only for x < 0.2. It is shown that terahertz-emission efficiency is not deteriorated with increasing Mn-doping (x). The magnetic moment of thin films (t 85 nm) exhibits only a weak enhancement with increasing x —a feature suggesting that Mn-doping is ineffective in inducing ferromagnetism in BiFeO3. The thicker films (t 150 nm), on the contrary, possess larger magnetic moment which evidently arises from the segregated magnetic MnFe2O4 phase.
77.22.Ej - Polarization and depolarization.
77.84.-s - Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials.
78.47.-p - Spectroscopy of solid state dynamics.
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