Volume 88, Number 6, December 2009
Article Number 67004
Number of page(s) 5
Section Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties
Published online 01 December 2009
EPL, 88 (2009) 67004
DOI: 10.1209/0295-5075/88/67004

Surface vs. bulk electronic structure of silver determined by photoemission

N. J. Speer1, 2, M. K. Brinkley1, 2, Y. Liu1, 2, C. M. Wei3, T. Miller1, 2 and T.-C. Chiang1, 2, 4

1   Department of Physics, University of Illinois at Urbana-Champaign - Urbana, IL 61801-3080, USA
2   Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign Urbana, IL 61801-2902, USA
3   Institute of Atomic and Molecular Sciences, Academia Sinica, No. 1, Sec. 4 - Roosevelt Road, Taipei, Taiwan 10617, Republic of China
4   Department of Physics, National Tsing Hua University - 101, Section 2, Kuang-Fu Road, Hsinchu, Taiwan 30013, Republic of China

received 26 November 2009; accepted in final form 27 November 2009; published December 2009
published online 17 December 2009

Whether photoemission probes surface or bulk properties has long been a topic of interest and debate. This work employs angle-resolved photoemission to map the electronic structure of Ag films of varying thicknesses prepared on Si(111). As expected, the discrete quantum-well states or subbands observed at small thicknesses merge into a continuum as the film thickness approaches the bulk limit. However, a number of discrete states remain isolated within gaps or pockets in the bulk continuum. While these Ag surface states have been predicted previously by calculations, most are experimentally identified herein only for the first time.

73.21.Fg - Quantum wells.
73.20.At - Surface states, band structure, electron density of states.
79.60.Dp - Adsorbed layers and thin films.

© EPLA 2009