Issue |
Europhys. Lett.
Volume 34, Number 4, May I 1996
|
|
---|---|---|
Page(s) | 281 - 286 | |
Section | Condensed matter: electronic structure, electrical, magnetic and optical properties | |
DOI | https://doi.org/10.1209/epl/i1996-00451-1 | |
Published online | 01 September 2002 |
Evidence of 3D-XY critical behaviour in La2-xSrxCuO4 films
1
IBM Research Division, Zurich Research Laboratory - 8803 Rüschlikon, Switzerland
2
Institut de Physique, Université de Neuchâtel - 2000 Neuchâtel,
Switzerland
3
Département de Physique de la Matière Condensée, Université de Genève
1211 Genève, Switzerland
Received:
21
December
1995
Accepted:
12
March
1996
We report measurements of the "zero field" ac sheet impedance for thin, c-axis–oriented
films. For sufficiently thin films of thickness d, the magnetic
penetration depth
is given by
. We find that the temperature and intriguing doping dependence
of Lk as well as the amplitude of the perpendicular real-space
phase correlation length
are fully
consistent with the critical behaviour of the three-dimensional XY
model and finite-size scaling. Moreover, invoking finite-size
scaling, we determine the value of the critical amplitude of
.
PACS: 74.20.-z – Superconductivity: theory / 74.25.-q – General properties; correlations between physical properties in normal and superconducting states / 74.72.Dn – La-based compounds
© EDP Sciences, 1996
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