| Issue |
Europhys. Lett.
Volume 46, Number 1, April I 1999
|
|
|---|---|---|
| Page(s) | 101 - 106 | |
| Section | Cross-disciplinary physics and related areas of science and technology | |
| DOI | https://doi.org/10.1209/epl/i1999-00567-2 | |
| Published online | 01 September 2002 | |
Imaging vesicle adhesion by Evanescent Wave-Induced Fluorescence
1
Laboratoire de Physique de la Matière Condensée (Unité
Associée au CNRS (URA 792).) , Collège de France
11 place Marcelin Berthelot,
75231 Paris Cedex 05, France
2
Département de Chimie (Unité Associée au
CNRS (URA 1679).) ,
École Normale Supérieure 24 rue Lhomond,
75231 Paris Cedex 05, France
3
Institut Charles Sadron (Unité Propre du
CNRS (UPR 022).) - 6 rue Boussingault 67083 Strasbourg Cedex, France
Received:
4
May
1998
Accepted:
19
January
1999
We present a new method to study the adsorption of vesicles on solid substrates, combining the use of the evanescent wave-induced fluorescence (EWIF) and classical optical microscopy. We show in this paper that our method can clearly discriminate between a spherical vesicle just touching the substrate and a spread vesicle: this method should thus be useful to design and tailor substrates for controlled adhesion.
PACS: 82.65.Fr – Film and membrane processes: ion exchange,dialysis, osmosis, electroosmosis / 87.64.-t – Spectroscopic and microscopic techniques in biophysics and medical physics / 82.70.Dd – Colloids
© EDP Sciences, 1999
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