Volume 48, Number 3, November I 1999
|Page(s)||276 - 279|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||01 September 2002|
Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface
Institute of Applied Physics and Microstructure Research Center, University of Hamburg Jungiusstr. 11, D-20355 Hamburg, Germany
Accepted: 3 September 1999
The (111) surface of a xenon thin film as well as of the graphite substrate have been studied on the atomic-scale using dynamic scanning force microscopy. The extremely stable conditions required for the successful imaging of the insulating and weakly bound noble-gas crystal were realised by operating the microscope at low temperatures in ultrahigh vacuum. This achievement enables detailed investigations of a class of materials which has up to now been inaccessible to microscopical methods providing atomic resolution and gives a clear proof for the possibility to gain atomic resolution images in dynamic scanning force microscopy on weakly interacting, vulnerable surfaces.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc / 68.35.Bs – Surface structure and topography / 61.66.Bi – Elemental solids
© EDP Sciences, 1999
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