| Issue |
Europhys. Lett.
Volume 58, Number 5, June 2002
|
|
|---|---|---|
| Page(s) | 785 - 791 | |
| Section | Interdisciplinary physics and related areas of science and technology | |
| DOI | https://doi.org/10.1209/epl/i2002-00418-8 | |
| Published online | 01 May 2002 | |
Enhanced counterion localization induced by surface charge modulation
1
Departments of Materials and Interfaces, Weizmann Institute - 76100
Rehovot, Israel
2
Department of Physics and Astronomy,
University of Pennsylvania Philadelphia, PA 19104, USA
3
Department of Physics and Materials Research Laboratory,
University of California Santa Barbara, CA 93106-9530, USA
Received:
26
November
2001
Accepted:
7
March
2002
Using both small-amplitude and singular-perturbation theories we predict theoretically that the presence of surface charge modulations gives rise to an enhancement of the counterion density near the surface above and beyond that of a uniform, charged surface. We confirm these predictions with Monte Carlo simulations. Our study focuses on the weak- to moderate-coupling regime which is complementary to a similar investigation performed by Moreira and Netz (Europhys. Lett., 57 (2002) 911) in the strong-coupling case.
PACS: 82.70.-y – Disperse systems; complex fluids / 61.20.Qg – Structure of associated liquids: electrolytes, molten salts, etc
© EDP Sciences, 2002
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