Volume 59, Number 3, August 2002
|Page(s)||458 - 464|
|Section||Condensed matter: electronic structure, electrical, magnetic, and optical properties|
|Published online||01 September 2002|
Roughness-induced enhancement of giant magnetoresistance in epitaxial trilayers
Institut für Festkörperforschung, Forschungszentrum
Jülich GmbH D-52425 Jülich, Germany
Corresponding author: firstname.lastname@example.org
Accepted: 6 May 2002
We grow high-quality epitaxial Fe/Cr/Fe trilayers on Au(001) buffer layers and control the roughness of the Fe/Cr interfaces by stopping the deposition of Fe and Cr at a reflection high-energy electron diffraction (RHEED) intensity maximum or minimum. We thus obtain pairs of identical samples which only differ by their interface roughness as confirmed by X-ray reflectivity. Magneto-optical hysteresis loops reveal perfect antiparallel alignment at low fields for all samples. The current-in-plane giant magnetoresistance (CIP-GMR) of trilayers with rougher interfaces is significantly enhanced.
PACS: 75.70.Cn – Interfacial magnetic properties (multilayers) / 75.70.Pa – Giant magnetoresistance / 68.35.Ct – Interface structure and roughness
© EDP Sciences, 2002
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