Issue |
Europhys. Lett.
Volume 60, Number 5, December 2002
|
|
---|---|---|
Page(s) | 782 - 787 | |
Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
DOI | https://doi.org/10.1209/epl/i2002-00376-7 | |
Published online | 01 November 2002 |
Substrate-suppressed phase transition in nano-crystalline
thin films
1
Department of Materials and Interfaces, Weizmann
Institute of Science Rehovot, 76100, Israel
2
Department of Materials and Nuclear Engineering, University
of Maryland College Park, MD, 20742, USA
Received:
17
June
2002
Accepted:
16
September
2002
Upon substrate removal nano-crystalline cubic thin
films transformed into the tetragonal phase. Randomly oriented
nano-crystalline
films were prepared with moderate
residual tensile stress by sol-gel processing or RF sputtering.
The low dielectric constant
and the X-ray
diffraction spectra identified the films as being cubic at room
temperature. Despite the tensile stress in the
substrate-supported films, the free-standing films became
corrugated, indicating 0.3–0.5% lateral expansion. The fact
that the cubic-to-tetragonal phase transition was responsible for
the lateral expansion has been confirmed by a fivefold increase
of the dielectric constant
and a detectable
piezoelectric effect.
PACS: 77.55.+f – Dielectric thin films / 77.22.Ch – Permittivity (dielectric function) / 77.80.Dj – Domain structure; hysteresis
© EDP Sciences, 2002
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