| Issue |
Europhys. Lett.
Volume 64, Number 6, December 2003
|
|
|---|---|---|
| Page(s) | 830 - 836 | |
| Section | Interdisciplinary physics and related areas of science and technology | |
| DOI | https://doi.org/10.1209/epl/i2003-00633-9 | |
| Published online | 01 November 2003 | |
Phase-sensitive acoustic imaging and micro-metrology of polymer blend thin films
1
Institüt für Experimentelle Physik II,
Universität Leipzig Linnéstr. 5, D-04103
Leipzig, Germany
2
Department of Civil Engineering
and Engineering Mechanics University of Arizona - Tucson,
AZ 85721, USA
Received:
25
July
2003
Accepted:
6
October
2003
Scanning acoustic microscopy with vector contrast (PSAM) at
1.2
is employed for three-dimensional real-space
measurements of structure in PS/PMMA (polystyrene/ poly(methyl
methacrylate)) blend films, spun-cast on glass and silicon
substrates. Processing of the digitized phase and amplitude
images yields information on the surface structure and internal
structure of the blend films. The complex V(z) functions render
qualitative and quantitative material contrast for each image
pixel and, hence, permit the characterization of individual
domains. It is shown that PSAM can provide valuable insights
regarding the polymer blend film morphology and micro-mechanical
properties, not acquirable by other ways.
PACS: 83.80.Tc – Polymer blends / 68.60.Bs – Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties): Mechanical and acoustical properties / 68.55.-a – Thin film structure and morphology
© EDP Sciences, 2003
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