Issue |
Europhys. Lett.
Volume 64, Number 6, December 2003
|
|
---|---|---|
Page(s) | 790 - 796 | |
Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
DOI | https://doi.org/10.1209/epl/i2003-00627-1 | |
Published online | 01 November 2003 |
Hole doping dependence of the coherence length
in 

x
thin films
1
National Laboratory for Superconductivity,
Institute of Physics and Center for Condensed Matter Physics,
Chinese Academy of Sciences
P.O. Box 603, Beijing 100080, PRC
2
Department of Physics, The Pennsylvania State University
University Park, PA 16802, USA
Received:
5
August
2003
Accepted:
15
October
2003
By measuring the field and temperature dependence of magnetization
on systematically doped x
thin films, the critical current density
and the
collective pinning energy
are determined in
single-vortex creep regime. Together with the published data of
superfluid density, condensation energy and anisotropy, for the
first time we derive the doping dependence of the coherence
length or vortex core size in wide-doping regime directly from
the low-temperature data. It is found that the coherence length
drops in the underdoped region and increases in the overdoped
side with the increase of hole concentration. The result in the
underdoped region clearly prevents from taking the pseudogap
energy scale as the upper critical field.
PACS: 74.25.Dw – Superconductivity phase diagrams / 74.25.Ha – Magnetic properties / 74.20.Fg – BCS theory and its development
© EDP Sciences, 2003
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