| Issue |
Europhys. Lett.
Volume 67, Number 2, July 2004
|
|
|---|---|---|
| Page(s) | 240 - 246 | |
| Section | Interdisciplinary physics and related areas of science and technology | |
| DOI | https://doi.org/10.1209/epl/i2004-10052-6 | |
| Published online | 01 July 2004 | |
Layer-dependent band dispersion and correlations using tunable soft X-ray ARPES
1
RIKEN, Harima Institute - 1-1-1 Kouto, Mikazuki, Sayo, Hyogo 679-5148, Japan
2
Institute for Plasma Research - Bhat, Gandhinagar 382 428, Gujarat, India
3
SPring-8/JASRI - Mikazuki, Hyogo 679-5198, Japan
4
Institute for Solid State Physics, University of Tokyo Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
Received:
22
January
2004
Accepted:
3
May
2004
Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied
to study in-plane band dispersions of nickel as a function of
probing depth. Photon energies between 
and 780
were used to effectively probe up to 
–7 layers (
–12
). The results show layer-dependent band dispersion
of the 
minority spin band which crosses the
Fermi level in 3 or more layers, in contrast to the known top 1-2
layers dispersion obtained using ultra-violet rays. The layer
dependence corresponds to an increased value of exchange
splitting and suggests reduced-correlation effects in the bulk
compared to the surface.
PACS: 71.20.Be – Transition metals and alloys / 79.60.-i – Photoemission and photoelectron spectra / 75.50.Cc – Other ferromagnetic metals and alloys
© EDP Sciences, 2004
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