Volume 67, Number 2, July 2004
|Page(s)||240 - 246|
|Section||Interdisciplinary physics and related areas of science and technology|
|Published online||01 July 2004|
Layer-dependent band dispersion and correlations using tunable soft X-ray ARPES
RIKEN, Harima Institute - 1-1-1 Kouto, Mikazuki, Sayo, Hyogo 679-5148, Japan
2 Institute for Plasma Research - Bhat, Gandhinagar 382 428, Gujarat, India
3 SPring-8/JASRI - Mikazuki, Hyogo 679-5198, Japan
4 Institute for Solid State Physics, University of Tokyo Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
Accepted: 3 May 2004
Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of nickel as a function of probing depth. Photon energies between and 780 were used to effectively probe up to –7 layers (–12). The results show layer-dependent band dispersion of the minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.
PACS: 71.20.Be – Transition metals and alloys / 79.60.-i – Photoemission and photoelectron spectra / 75.50.Cc – Other ferromagnetic metals and alloys
© EDP Sciences, 2004
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