Volume 68, Number 5, December 2004
|Page(s)||658 - 663|
|Section||Condensed matter: structure, mechanical and thermal properties|
|Published online||03 November 2004|
Omnidirectional reflection of electromagnetic waves on Thue-Morse dielectric multilayers
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University - Nanjing 210093, PRC
Corresponding author: email@example.com
Accepted: 1 October 2004
We report here the reflection of electromagnetic waves in self-similar Thue-Morse dielectric multilayers, which presents the features of multiple omnidirectional photonic bandgaps (PBGs). The number and the width of omnidirectional PBG depend on the ratio of the refraction indexes and the thicknesses of the dielectric materials. The theoretical result is partly verified by optical observation in Thue-Morse multilayers with visible and near-infrared light. Our investigations provide a new approach to achieve the omnidirectional reflection in multiple frequency ranges. With this progress, the application of dielectric reflection mirrors can be further widened.
PACS: 61.44.Br – Quasicrystals / 42.70.Qs – Photonic bandgap materials / 78.67.Pt – Multilayers; superlattices
© EDP Sciences, 2004
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