Volume 71, Number 1, July 2005
|Page(s)||77 - 83|
|Section||Condensed matter: structural, mechanical and thermal properties|
|Published online||08 June 2005|
Selective study of atoms in rough surfaces by means of off-specular grazing incidence XAFS
Fachbereich C, Abteilung Physik, Bergische Universität Wuppertal Gaussstrasse 20, 42097 Wuppertal, Germany
Corresponding author: firstname.lastname@example.org
Accepted: 29 April 2005
A new method of grazing incidence X-ray absorption spectroscopy using an off-specular reflection geometry is presented. Using such an asymmetric setup, with the detector centered at the Yoneda peak, this technique is sensitive to lateral heterogeneities which typically occur at surfaces or interfaces. Oscillations in the spectra above the absorption edges of selected elements enable the atomic short-range order around the X-ray absorbing atom within the surface region to be determined. The data analysis is done in the framework of the distorted wave Born approximation (DWBA).
PACS: 61.10.Ht – X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc / 61.10.Kw – X-ray reflectometry (surfaces, interfaces, films) / 68.35.Ct – Interface structure and roughness
© EDP Sciences, 2005
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