Issue |
Europhys. Lett.
Volume 71, Number 4, August 2005
|
|
---|---|---|
Page(s) | 686 - 691 | |
Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
DOI | https://doi.org/10.1209/epl/i2005-10128-9 | |
Published online | 27 July 2005 |
Effect of oxygen pressure on structural modulation observed by X-ray reciprocal space mapping in epitaxial bismuth cuprate superconducting film
1
Kanagawa Industrial Technology Research Institute 705-1 Shimo-Imaizumi, Ebina, Kanagawa 243-0435, Japan
2
PANAlytical - 1-7-3 Hamamatsucho, Minato-Ku, Tokyo 105-0013, Japan
3
Department of Innovative and Engineered Materials, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8502, Japan
4
Materials & Structures Laboratory, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan
Received:
15
April
2005
Accepted:
22
June
2005
x (
-2212) single
layers were prepared on
substrates in different
conditions of oxygen pressure using a 266
laser generated by
slower Q-switched YAG system. Several X-ray diffraction methods
were employed to investigate the crystal structure of
-2212. X-ray diffraction (XRD) methods of θ-2θ and ϕ scan were used to verify the epitaxial
growth of
-2212(001), and reciprocal space mapping (RSM)
of ω-
was employed to investigate
in-plane lattice constants and structural modulation.
Satellite peaks generated by structural modulation on the RSM
showed asymmetric distribution around the main peak. The
periodicity of modulation was evaluated using satellite peaks on
the RSM. With increasing oxygen pressure, the lattice constant
expanded along the c-axis and contracted along the b-axis,
while structural modulation expanded along both b- and c-axis
directions.
PACS: 74.78.Bz – High-Tc films / 61.44.Fw – Incommensurate crystals / 61.10.-i – X-ray diffraction and scattering
© EDP Sciences, 2005
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