| Issue |
Europhys. Lett.
Volume 74, Number 3, May 2006
|
|
|---|---|---|
| Page(s) | 519 - 525 | |
| Section | Condensed matter: electronic structure, electrical, magnetic, and optical properties | |
| DOI | https://doi.org/10.1209/epl/i2005-10544-9 | |
| Published online | 22 March 2006 | |
Thomas-Fermi model of electronic screening in semiconductor nanocrystals
1
Coherentia CNR-INFM and Università di Napoli Federico II, Dipartimento di Scienze Fisiche, Complesso Universitario Monte S. Angelo - via Cintia, I-80126 Napoli, Italy
2
TFVS, Universiteit Antwerpen - Universiteitsplein 1, B-2610 Antwerpen, Belgium
3
CNR-INFM-S$\mth{^{\mathit 3}}$ and Dipartimento di Scienze e Metodi dell'Ingegneria Università di Modena e Reggio Emilia - via Fogliani, I-42100 Reggio Emilia, Italy
Received:
29
November
2005
Accepted:
28
February
2006
Using first-principle density-functional theory in the GGA approximation we have studied the electronic screening in semiconductor nanocrystals. Combining simple electrostatics and the Thomas-Fermi theory it is shown that an analytical and general form of a model position-dependent screening function can be obtained. Taking as a case study silicon nanocrystals, the relative weights of the nanocrystal core and surface polarization contribution to the screening are thoroughly discussed. The connection between the screening at the nanoscale and in the bulk is clarified.
PACS: 78.67.Bf – Nanocrystals and nanoparticles / 71.45.Gm – Exchange, correlation, dielectric and magnetic response functions, plasmons
© EDP Sciences, 2006
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