Volume 78, Number 1, April 2007
|Number of page(s)||4|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||15 March 2007|
Analysis of characteristic matrix for a uniaxially birefringent thin film
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences - Shanghai 201800, China
Corresponding author: firstname.lastname@example.org
Accepted: 15 February 2007
As the principal section consistent with the principal plane, electromagnetic propagation in a uniaxially birefingent thin film can be described with a concise characteristic matrix, in which the refractive indices of the forward and backward propagating extraordinary rays are different and dependent. In this letter, based on Huygen's construction, the refractive indices and effective optical admittances of the forward and backward propagating extraordinary rays are discussed further, and the characteristic matrix is simplified. Furthermore, the input optical admittance, reflectance and transmittance of assembly is presented, just as an isotropic thin film. The result can be extended to the general case of multilayer uniaxially birefringent thin films with their optic axes in the incident plane.
PACS: 78.20.Fm – Birefringence / 78.20.Ci – Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) / 77.55.+f – Dielectric thin films
© Europhysics Letters Association, 2007
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