Issue |
EPL
Volume 82, Number 1, April 2008
|
|
---|---|---|
Article Number | 17003 | |
Number of page(s) | 6 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/82/17003 | |
Published online | 05 March 2008 |
Electron energy loss spectroscopy determination of Ti oxidation state at the (001) LaAIO3/SrTiO3 interface as a function of LaAIO3 growth conditions
1
Unité mixte de physique CNRS/Thales and Université Paris-Sud-XI - Route départementale 128, 91767 Palaiseau cedex, France, EU
2
Laboratoire de physique des solides CNRS UMR8502, Université Paris-Sud-11 - 91405 Orsay cedex, France, EU
3
Institut d'électronique, de microélectronique et de nanotechnologie, Unité Mixte de Recherche CNRS 8520 avenue Poincaré, BP 69, 59652 Villeneuve d'Ascq cedex, France, EU
4
GEMaC-UMR 8635, CNRS - 1 place Aristide Briand, 92195 Meudon cedex, France, EU
Corresponding author: jean-luc.maurice@thalesgroup.com
Received:
1
December
2007
Accepted:
5
February
2008
After the epitaxy of LaAlO3 on a TiO2-terminated {100} surface of SrTiO3, a high-mobility electron gas may appear, which has been the object of numerous works over the last four years. Its origin is a subject of debate between the interface polarity and unintended doping. Here we use electron energy loss “spectrum images”, recorded in cross-section in a scanning transmission electron microscope, to analyse the Ti3+ ratio, characteristic of extra electrons. We find an interface concentration of Ti3+ that depends on growth conditions.
PACS: 73.61.Ng – Insulators / 73.20.-r – Electron states at surfaces and interfaces / 79.20.Uv – Electron energy loss spectroscopy
© EPLA, 2008
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