Volume 102, Number 5, June 2013
|Number of page(s)||6|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||27 June 2013|
Atomic rearrangements at the TiO2-terminated (001)SrTiO3 surface and growth of thin LaMnO3 films
1 Ioffe Physical-Technical institute, RAS - 194021 St. Petersburg, Russia
2 Chalmers University of Technology - S-41296 Gothenburg, Sweden, EU
3 Skobeltsyn Institute of Nuclear Physics, Department of Physics, Moscow State University - 119899 Moscow, Russia
Received: 4 April 2013
Accepted: 31 May 2013
SrTiO3 is commonly used as a substrate for growth of various oxide films. Different reconstructions at the SrTiO3 surface have been claimed. A question is whether these survive subsequent depositions of thin films and influence film properties. Medium energy ion scattering (MEIS) was used to probe structure and composition of the surface layer of a TiO2-terminated (001)SrTiO3 single-crystal substrate and 1–4 unit cell (u.c.) thick LaMnO3 epilayers. Aligned spectra indicate enrichment of Ti at the surface and a TiO2 double-layer (DL) configuration. The DL arrangement survives pulsed-laser deposition of LaMnO3 in a background of high oxygen pressure (5 × 10−2 mbar) while it is destroyed at lower oxygen pressure (10−4 mbar). Simulations of random MEIS spectra indicate substantial interdiffusion and La doping of the substrate surface but all interfaces are nevertheless insulating.
PACS: 68.35.-p – Solid surfaces and solid-solid interfaces: structure and energetics / 68.35.Ct – Interface structure and roughness / 82.80.Yc – Rutherford backscattering (RBS), and other methods of chemical analysis
© EPLA, 2013
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