Volume 82, Number 4, May 2008
|Number of page(s)||1|
|Published online||07 May 2008|
A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging
Department of Engineering Materials, University of Sheffield - Mappin Street, Sheffield S1 3JD, UK, EU
2 Department of Electronic and Electrical Engineering, University of Sheffield - Mappin Street, Sheffield S1 3JD, UK, EU
Accepted: 29 March 2008
This article has no abstract.
PACS: 99.10.Cd – Errata
© EPLA, 2008
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