Issue |
EPL
Volume 84, Number 6, December 2008
|
|
---|---|---|
Article Number | 67016 | |
Number of page(s) | 5 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/84/67016 | |
Published online | 12 January 2009 |
Implications of phase-segregation on structure, terahertz emission and magnetization of Bi (FeMnx)O3 (0 x 0.5) thin films
1
Institute of Laser Engineering, Osaka University - 2-6 Yamadaoka, Suita 565-0871, Osaka, Japan
2
Institute of Scientific and Industrial Research, Osaka University - 8-1 Mihogaoka, Ibaraki 567-0047, Osaka, Japan
Corresponding authors: rana-d@ile.osaka-u.ac.jp tonouchi@ile.osaka-u.ac.jp
Received:
23
July
2008
Accepted:
18
November
2008
Structural, magnetic and terahertz emission properties of Bi (FeMnx)O3 (0 x 0.5) thin films of various thicknesses were studied. A transition from coherently strained structure to relaxed structure at a film thickness (t) of ~ 80– 90 nm occurs only for x < 0.2. It is shown that terahertz-emission efficiency is not deteriorated with increasing Mn-doping (x). The magnetic moment of thin films (t 85 nm) exhibits only a weak enhancement with increasing x —a feature suggesting that Mn-doping is ineffective in inducing ferromagnetism in BiFeO3. The thicker films (t 150 nm), on the contrary, possess larger magnetic moment which evidently arises from the segregated magnetic MnFe2O4 phase.
PACS: 77.22.Ej – Polarization and depolarization / 77.84.-s – Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials / 78.47.-p – Spectroscopy of solid state dynamics
© EPLA, 2008
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.