Volume 86, Number 5, June 2009
|Number of page(s)||5|
|Section||Electromagnetism, Optics, Acoustics, Heat Transfer, Classical Mechanics, and Fluid Dynamics|
|Published online||09 June 2009|
Buckling patterns of gold thin films on silicon substrates: Formation of superimposed blisters
PHYMAT-CNRS UMR 6630, Université de Poitiers - BP 30179, 86962 Futuroscope Cedex, France, EU
Corresponding author: email@example.com
Accepted: 8 May 2009
Buckling phenomena leading to the formation of superimposed blisters have been experimentally observed with the help of a confocal interferometric microscope onto the surface of gold thin films deposited on silicon substrates. Assuming that residual folding effects resulting from plastic deformation mechanisms take place in the film during its morphological evolution, different probable scenarios for the formation of the observed buckling patterns are elaborated in the framework of the Föppl-von Karman's theory of thin plates. Multi-step buckling with growing interface delamination is considered for the first scenario while a single or multi-step buckling at a given delamination width is assumed for the other ones.
PACS: 46.32.+x – Static buckling and instability / 68.55.-a – Thin film structure and morphology / 61.72.Lk – Linear defects: dislocations, disclinations
© EPLA, 2009
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