Temperature-dependent fatigue rate in ferroelectric thin films

J.-Y. Hwang; S.-A. Lee; S.-Y. Jeong; C.-R. Cho

doi:10.1209/epl/i2005-10604-2

All issues

Volume 76 / No 1 (October 2006)

Europhys. Lett., 76 1 (2006) 88-94

Abstract

Issue		Europhys. Lett. Volume 76, Number 1, October 2006


Page(s)		88 - 94
Section		Condensed matter: structural, mechanical and thermal properties
DOI		https://doi.org/10.1209/epl/i2005-10604-2
Published online		06 September 2006

Europhys. Lett., 76 (1), pp. 88-94 (2006)

Temperature-dependent fatigue rate in ferroelectric $\chem{Bi_{3.25}La_{0.75}Ti_{3}O_{12}}$ thin films

J.-Y. Hwang¹, S.-A. Lee², S.-Y. Jeong³ and C.-R. Cho⁴

¹ Nano-Surface Technology Research Lab, Korea Basic Science Institute Busan 609-735, Korea
² Department of Physics, Pusan National University - Busan 609-735, Korea
³ School of Nano-Science and Technology, Pusan National University Busan 609-735, Korea
⁴ Department of Nanomedical Engineering and PNU-Fraunhofer IGB Joint Research Center, Pusan National University - Miryang 627-706, Korea

Corresponding authors: jaeyeol@gmail.com crcho@pusan.ac.kr

Received: 5 December 2005
Accepted: 1 August 2006

Abstract

Bismuth-layer–structured ferroelectric (BLSF) thin films with a composition of $\chem{Bi_{3.25}La_{0.75}Ti_{3}O_{12}}$ were prepared by an acetic-acid–based sol-gel route. The ferroelectric, dielectric, and fatigue characteristics of the films over a wide temperature range from 300 $\un{K}$ to 100 $\un{K}$ were analyzed by using a computerized measurement system. The fatigue characteristic of the film was improved with decreasing temperature. This behavior is attributed to the temperature-dependent changes of domain movement (or freezing), diffusivity (or mobility) of charged defects, and their interactions. It was found that the onset of fatigue ( $\propto$ $\it{f/T}$ ) and the fatigue rate ( $\propto$ $\it{T}$ ) were temperature-dependent parameters. The activation energy of the fatigue rate in sol-gel–derived BLT films was about 1.07 $\un{eV}$ , which coincides with that of oxygen vacancies in perovskite-type materials. We suggest that the fatigue mechanism in the BLT system is mainly due to the behavior (or movement) of oxygen vacancies.

PACS: 68.60.Dv – Thermal stability; thermal effects / 77.55.+f – Dielectric thin films / 77.80.-e – Ferroelectricity and antiferroelectricity

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