Volume 85, Number 5, March 2009
|Number of page(s)||4|
|Section||Interdisciplinary Physics and Related Areas of Science and Technology|
|Published online||16 March 2009|
Growth of Ge dots on templated Si substrates with diffusion-altered holes
Forschungszentrum Jülich, Institute of Bio- and Nanosystems 1 - Leo Brandt Strasse, 52428 Jülich, Germany, EU
2 JARA - Fundamentals of Future Information Technologies
Corresponding author: firstname.lastname@example.org
Accepted: 9 February 2009
We have studied the impact of the hole shape on the growth of Ge dots. Si substrates that have been templated by means of electron beam lithography and reactive ion etching have been used to grow Si buffer layers at different substrate temperatures by molecular-beam epitaxy. Atomic-force-microscopy studies show that for high substrate temperatures, the prepatterned holes are smeared out. A model has been employed to quantitatively analyze the smearing out of the holes. The study further shows that the shape of the holes has a substantial impact on the morphology of the subsequently grown Ge dots, i.e. Ge dots grown in smeared out holes show a tendency towards an inhomogeneous size distribution and the formation of multiple dots in one hole.
PACS: 81.07.Ta – Nanoscale materials and structures: fabrication and characterization: Quantum dots / 68.55.ag – Semiconductors / 68.60.Dv – Thermal stability; thermal effects
© EPLA, 2009
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.