Volume 91, Number 5, September 2010
|Number of page(s)||5|
|Section||Condensed Matter: Structural, Mechanical and Thermal Properties|
|Published online||15 September 2010|
Smoothing and coherent structure formation in organic-organic heterostructure growth
Institut für Angewandte Physik Universität Tübingen - 72076 Tübingen, Germany, EU
2 Department of Chemistry, University of California - Berkeley, CA 94720, USA
3 ESRF - 6 Rue Jules Horowitz, BP 220, 38043 Grenoble Cedex 9, France, EU
4 Institut für Theoretische Physik, Universität zu Köln - 50937 Köln, Germany, EU
Accepted: 13 August 2010
We use in situ real-time X-ray reflectivity and complementary atomic force microscopy to monitor crystallinity and roughness evolution during growth of organic heterostructures, i.e. perfluoropentacene (PFP) on diindenoperylene (DIP) and pentacene (PEN) on PFP. For both systems, surface smoothing during thermal evaporation of the second material on top of the first is observed. The smoothing can be rationalized by a, compared to homoepitaxy, lowered step edge barrier for one species diffusing on the other. In addition, we find an exceptionally well-ordered interface for PEN-on-PFP growth and PEN growth with anomalously low roughening, along with coherent scattering over the entire thickness.
PACS: 68.35.Ct – Interface structure and roughness / 68.55.A- – Nucleation and growth / 68.35.bm – Polymers, organics
© EPLA, 2010
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