Volume 109, Number 3, February 2015
|Number of page(s)||5|
|Section||Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties|
|Published online||19 February 2015|
Ion energy spread in laser-assisted atom probe tomography
Normandie Université; Groupe de Physique des Matériaux; UMR 6634 CNRS, Université de Rouen, INSA de Rouen 76801 Saint Étienne du Rouvray, France
Received: 30 September 2014
Accepted: 28 January 2015
A dedicated setup has been developed to measure with precision the appearance energy of field evaporated ions in laser-assisted atom probe. Energy spreads down to 0.5 eV can be measured on different materials under different experimental conditions (electric field and laser illumination). Looking at each possible contributions, we show that this energy spread depends on the material and that it is due to the field evaporation process itself and especially to temperature-induced surface diffusion and electric-field strength in the case of metals and low-band-gap materials. For large-band-gap materials, a dependence on the laser illumination is shown.
PACS: 79.70.+q – Field emission, ionization, evaporation, and desorption / 79.20.Ds – Laser-beam impact phenomena
© EPLA, 2015
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